Boundary layer modeling of surface residual tension in postbuckling behavior of axially loaded silicon panels at nanoscale embedded in elastic foundations

dc.contributor.authorWang, Xianjie
dc.contributor.authorZhou, Guangen
dc.contributor.authorSafaei, Babak
dc.contributor.authorSahmani, Saeid
dc.date.accessioned2026-02-06T18:47:28Z
dc.date.issued2022
dc.departmentDoğu Akdeniz Üniversitesi
dc.description.abstractHere, nonlinear buckling and postbuckling properties of cylindrical silicon nanopanels of finite length resting on elastic foundation exposed to axial compression have been studied by taking into account surface free energy (SFE) effect. Size-dependent governing equations were constructed by integrating classical shell theory and Gurtin-Murdoch elasticity theory. Surrounding elastic media were considered as Pasternak foundations. Using shell buckling boundary layer theory, the influences of large deflections and SFE were extended to nonlinear instability analysis of nanopanels under axial loads. Finally, a perturbation-based solution procedure was applied to extract explicit equations for nanopanel postbuckling equilibrium paths at different surface elastic constants and geometric parameter values. It was revealed that surface effect related to positive surface elastic constant values shifted the minimum postbuckling domain point to lower maximum deflection while materials with negative surface values of elastic constant, SFE effect shifted the minimum point of postbuckling domain to higher maximum deflections.
dc.description.sponsorshipChina Scholarship Council
dc.description.sponsorshipThis study was funded by China Scholarship Council.
dc.identifier.doi10.1080/15397734.2020.1794889
dc.identifier.endpage3104
dc.identifier.issn1539-7734
dc.identifier.issn1539-7742
dc.identifier.issue9
dc.identifier.orcid0000-0002-1675-4902
dc.identifier.scopus2-s2.0-85088380827
dc.identifier.scopusqualityQ1
dc.identifier.startpage3087
dc.identifier.urihttps://doi.org/10.1080/15397734.2020.1794889
dc.identifier.urihttps://hdl.handle.net/11129/14397
dc.identifier.volume50
dc.identifier.wosWOS:000551622100001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherTaylor & Francis Inc
dc.relation.ispartofMechanics Based Design of Structures and Machines
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WoS_20260204
dc.subjectNanoscience
dc.subjectnonlinear instability
dc.subjectsurface elasticity
dc.subjectperturbation technique
dc.subjectsize dependency
dc.titleBoundary layer modeling of surface residual tension in postbuckling behavior of axially loaded silicon panels at nanoscale embedded in elastic foundations
dc.typeArticle

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